530.4175  / P618h2 <br/>
Pietsch, Ullrich <br/>
       High-resolution X-ray scattering : from thin films to lateral nanostructures 
 / Ullrich Pietsch, Vaclav Holy and Tilo Baumbach 
 .- 2nd 
 .- New York: Springer,  2004 
 .- xvi, 408p . 
<br><u>ISBN:</u> 9780387400921 
<br/><u>Subject Headings:</u> <br/>Thin films Optical properties;<br/>X-rays--Scattering;<br/>Xprays Diffraction;<br/>Nanostructure materials;
<br/><U>Author Added Entry: </u><br/>Holy, Vaclav;<br/>Baumbach, Tilo;
<br><U>Copy Details:</u><br> Acc. No.: <b>A177057</b>, Full Call No.: 530.4175 P618h2,   Item type:  Books , Location: General Stacks, <br><b>------------------------- --------------------- ------ --------- ------- ------- --------- -------- </b><br>