621.38152 / P289c
Pavlov, Andrei
CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test
/ Andrei Pavlov and Manoj Sachdev
.- New York: Springer, 2008
.- xvi, 193p .
.- ( Frontiers In Electronic Testing / Edited By Vishwani D. Agrawal V.40
ISBN: 9781402083624
Subject Headings:
Metaloxide semiconductors, complementary;
Author Added Entry:
Sachdev, Manoj;
Copy Details:
Acc. No.: A165755, Full Call No.: 621.38152 P289c, Item type: Books , Location: General Stacks,
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