621.3815 / SA14D2
Sachdev,Manoj,Gyvez,Jose Pineda De
DEFECT-ORIENTED TESTING FOR NANO-METRIC CMOS VLSI CIRCUITS
/
.- 2nd
.- Springer,Aa Dordrecht, 2007
.- xx,328 .
.- ( Frontiers In Electronic Testing
ISBN: 9780387465463
Subject Headings:
Metaloxide Semiconductors, Complementary -- Testing;
Metaloxide Semiconductors, Complementary -- Defects;
Integrated Circuits -- Very Largescale Integration -- Testing;
Author Added Entry:
Agarwal,Vishwani D.;
Copy Details:
Acc. No.: A159498, Full Call No.: 621.3815 SA14D2, Item type: Books , Location: COMPACT STORAGE (BASEMENT),
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