502.825  / EG28P <br/>
Egerton,Ray F. <br/>
       PHYSICAL PRINCIPLES OF ELECTRON MICROSCOPY 
 / AN INTRODUCTION TO TEM, SEM AND AEM 
 .-  Springer Science+Business Media Inc., New York,  2005 
 .- v,202 . 
<br><u>ISBN:</u> 0 387 25800 0 
<br/><u>Subject Headings:</u> <br/>Scanning Electron Microscopy;<br/>Electron Microscopy;<br/>X-Ray Microanalysis;
<br><U>Copy Details:</u><br> Acc. No.: <b>A153884</b>, Full Call No.: 502.825 EG28P,   Item type:  Books , Location: General Stacks, <br><b>------------------------- --------------------- ------ --------- ------- ------- --------- -------- </b><br>