621.39732  / J559t <br/>
Jha, Niraj K. <br/>
       TESTING AND RELIABLE DESING OF CMOS CIRCUITS 
 / 
 .- Boston: Kluwer Academic Pub.,  c1990 
 .- xiii,231 . 
<br><u>ISBN:</u> 07923390563 
<br/><u>Subject Headings:</u> <br/>Metal Oxide Semiconductors, Complementary -- Testing;<br/>Metal Oxide Semiconductros, Complementary -- Raliability;<br/>Integrated Circuits -- Very Large Scale Integration;
<br/><U>Author Added Entry: </u><br/>Kundu, Sandip;
<br><U>Copy Details:</u><br> Acc. No.: <b>A113982</b>, Full Call No.: 621.39732 J559t,   Item type:  Written-off , Location: , <br><b>------------------------- --------------------- ------ --------- ------- ------- --------- -------- </b><br>