621.381537 / F955L
Fujiwara, Hideo
LOGIC TESTING AND DESIGN FOR TESTABILITY
/
.- Cambridge: Mit Pr., 1985
.- x,284 .
.- ( Mit Press Series In Computer Systems
Subject Headings:
Logic Circuits -- Testing;
Copy Details:
Acc. No.: A98464, Full Call No.: 621.381537 F955L, Item type: Books , Location: COMPACT STORAGE (BASEMENT),
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