621.38173 / T789L
Tsui, Frank F.
LSI/VLSI TESTABILITY DESIGN
/
.- New York: Mcgraw-Hill, 1987
.- xv,702 .
Subject Headings:
Integrated Circuits -- Large Scale Integration -- Testing;
Integrated Circuits -- Very Large Scale Integration -- Testing;
Copy Details:
Acc. No.: A97602, Full Call No.: 621.38173 T789L, Item type: Books , Location: COMPACT STORAGE (BASEMENT),
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