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In situ mass analysis of particles by surface ionization mass spectrometry [NASA TM X-3112]

By: Lassiter, William S.

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BookSeries: National Aeronautics and Space Administration ; NASA Technical Note. Publisher: Washington, D. C. National Aeronautics and Space Administration 1974Description: 15p.Subject(s): Mass spectroscopy

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Item type	Current location	Collection	Call number	Vol info	Status	Date due	Barcode	Item holds
Technical Report	PK Kelkar Library, IIT Kanpur	COMPACT STORAGE (BASEMENT)		Bound vol. contains NASA TN X 3111-3119	Not for loan		TR002721

Total holds: 0

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Previous	Molecular orientation and mechanical anisotropy in polypropylene and poly (ethylene terephthalate) films [NASA TN D-5380]	Bending and compression tests of pressurized ring stiffened cylinders [NASA TN D-360]	-	In situ mass analysis of particles by surface ionization mass spectrometry [NASA TM X-3112]	Statistical summary air quality data for metropolitan cleveldan ohio 1967-1972 total suspended particulates nirogen dioxide and sulfur dioxide [NASA TM X-3113]	Aerodynamic roll of a T-tail transport configuration [NASA TM X-3115]	Fabrication of liquid rocket thrust chambers by electroforming [NASA TM X-3116]	Next

Bound vol. contains NASA TN X 3111-3119

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