Test control in BRI pseudo dynamic test system
By: Okamoto, Shin.
Contributor(s): Kaminosono, Takashi | Nakashima, Masayoshi | Kato, Hiroto.
Material type:![materialTypeLabel](/opac-tmpl/lib/famfamfam/BK.png)
Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
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PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | Reference | TR007107 |
Total holds: 0
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