Semiconductor material and device characterization [3rd ed.] [Perpetual access]
By: Schroder, Dieter K.
Publisher: New Jersey John Wiley & Sons 2006Edition: 3rd ed.ISBN: 9780471749097.Subject(s): SemiconductorDDC classification: 621.38152 | Sch75s3 Online resources: Click here to access online Summary: The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|
E books | PK Kelkar Library, IIT Kanpur | Electronic Resources | 621.38152 Sch75s3 (Browse shelf) | Available | EBK10589 |
Browsing PK Kelkar Library, IIT Kanpur Shelves , Collection code: Electronic Resources Close shelf browser
621.3813 P879m4 Microwave engineering [4th ed.] [Subscription ended] | 621.38152 D954s Semiconductor devices and circuits [Perpetual access till 2028] | 621.38152 Oh6m2 Materials science of thin films [2nd ed.] [Perpetual access] | 621.38152 Sch75s3 Semiconductor material and device characterization [3rd ed.] [Perpetual access] | 621.38153 Se29m7 Microelectronic circuits [7th ed.] [Perpetual access till February 2028] | 621.381952 K127o2 Optimization for engineering design [2nd ed.] [Perpetual access till 2029] | 621.3822 R198d Digital signal processing [Perpetual access till February 2028] |
The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques.
Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including:
Updated and revised figures and examples reflecting the most current data and information
260 new references offering access to the latest research and discussions in specialized topics
New problems and review questions at the end of each chapter to test readers' understanding of the material
In addition, readers will find fully updated and revised sections in each chapter.
Plus, two new chapters have been added:
Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy.
Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge.
Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials.
An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.
There are no comments for this item.