VLSI design and test
Contributor(s): Gaur, Manoj Singh [ed.].
Material type:
BookSeries: Communications in computer and information science / edited by Simone Diniz Junqueira Barbosa by ; no. 382. Publisher: Berlin Springer 2013Description: xi, 388p.ISBN: 9783642420238.Subject(s): Integrated circuits -- Very large scale integration -- Design and constructionDDC classification: 004 | V849 Summary: This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.
| Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
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Books
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PK Kelkar Library, IIT Kanpur | General Stacks | 004 V849 (Browse shelf) | Available | GB1262 |
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| 004 T63a Applied computer science | 004 T722 Trends in computational social choice | 004 T847s The second self | 004 V849 VLSI design and test | 004 V887I INTRODUCTION TO CIRCUIT COMPLEXITY | 004 W151t2 The TAO of computing | 004 W67E EXPLORATIONS IN QUANTUM COMPUTING |
This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.
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