Phenomeenes critiques, systemes aleatoires, theories de jauge : Critical phenomena, random systems, gauge theories
Contributor(s): Osterwalder, Konrad [ed.] | Stora, Raymond [ed.].
Material type:![materialTypeLabel](/opac-tmpl/lib/famfamfam/BK.png)
Item type | Current location | Collection | Call number | url | Status | Date due | Barcode | Item holds |
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PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 530.143 C869 (Browse shelf) | Book Request | Available | A96024 |
Total holds: 0
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