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Fringe 2005 : The 5th International Workshop on Automatic Processing of Fringe Patterns /

Contributor(s): Osten, Wolfgang [editor.2] | SpringerLink (Online service)0.
Material type: materialTypeLabelBookPublisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2006.Description: XVIII, 714 p. online resource.Content type: text Media type: computer Carrier type: online resourceISBN: 9783540293033.Subject(s): Engineering | Optics | Optoelectronics | Plasmons (Physics) | Control engineering | Robotics | Mechatronics | Manufacturing industries | Machines | Tools | Quality control | Reliability | Industrial safety.1 | Engineering.2 | Quality Control, Reliability, Safety and Risk.2 | Manufacturing, Machines, Tools.2 | Optics, Optoelectronics, Plasmonics and Optical Devices.2 | Control, Robotics, Mechatronics.1DDC classification: 658.56 Online resources: Click here to access online
Contents:
Key Note -- New Methods and Tools for Data Processing -- Resolution Enhanced Technologies -- Wide Scale 4D Optical Metrology -- Hybrid Measurement Technologies -- New Optical Sensors and Measurement Systems.
In: Springer eBooks0Summary: The purpose of the Fringe Proceedings is to present to engineers, scientists and industrial experts the state-of-the-art and the impact of Computer aided Evaluation in Structured Light Techniques, Holographic Interferometry, Classic Interferometry, Speckle Metrology, Moir� and Grid Techniques for Stress Analysis, Nondestructive Testing, Shape Measurement, Fault Detection, Quality Control and related fields. Topics of particular interest are: Advanced Computer Aided Measurement Techniques; Resolution Enhanced Technologies in Optical Metrology; New approaches in Wide Scale 4D Optical Metrology; Sophisticated Sensors Systems and their applications for the solution of challenging measurement problems. Special emphasis is put on modern Measurement Strategies taking into account the active combination of Physical Modeling, Computer Aided Simulation and Experimental Data Acquisition. Further attention is directed to new approaches for the Extension of Existing Resolution Limits that open the gates to Wide Scale Metrology ranging from nano to macro by using Advanced Optical Sensor Systems. .
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Item type Current location Call number Status Date due Barcode Item holds
PK Kelkar Library, IIT Kanpur
Available EBK8982
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Key Note -- New Methods and Tools for Data Processing -- Resolution Enhanced Technologies -- Wide Scale 4D Optical Metrology -- Hybrid Measurement Technologies -- New Optical Sensors and Measurement Systems.

The purpose of the Fringe Proceedings is to present to engineers, scientists and industrial experts the state-of-the-art and the impact of Computer aided Evaluation in Structured Light Techniques, Holographic Interferometry, Classic Interferometry, Speckle Metrology, Moir� and Grid Techniques for Stress Analysis, Nondestructive Testing, Shape Measurement, Fault Detection, Quality Control and related fields. Topics of particular interest are: Advanced Computer Aided Measurement Techniques; Resolution Enhanced Technologies in Optical Metrology; New approaches in Wide Scale 4D Optical Metrology; Sophisticated Sensors Systems and their applications for the solution of challenging measurement problems. Special emphasis is put on modern Measurement Strategies taking into account the active combination of Physical Modeling, Computer Aided Simulation and Experimental Data Acquisition. Further attention is directed to new approaches for the Extension of Existing Resolution Limits that open the gates to Wide Scale Metrology ranging from nano to macro by using Advanced Optical Sensor Systems. .

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