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Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching : Application to Rough and Natural Surfaces /

By: Kaupp, Gerd [author.].
Contributor(s): SpringerLink (Online service).
Material type: materialTypeLabelBookPublisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2006.Description: XII, 292 p. online resource.Content type: text Media type: computer Carrier type: online resourceISBN: 9783540284727.Subject(s): Engineering | Science | Physical chemistry | Optics | Optoelectronics | Plasmons (Physics) | Nanotechnology | Engineering | Nanotechnology and Microengineering | Science, general | Physical Chemistry | Nanotechnology | Optics, Optoelectronics, Plasmonics and Optical Devices | Engineering, generalDDC classification: 620.5 Online resources: Click here to access online
Contents:
Atomic Force Microscopy -- Scanning Near-Field Optical Microscopy -- Nanoindentation -- Nanoscratching.
In: Springer eBooksSummary: Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm. New or improved instrumentation, new physical laws and unforeseen new applications in all branches of natural sciences (around physics, chemistry, mineralogy, materials science, biology and medicine) and nanotechnology are covered as well as the sources for pitfalls and errors. It outlines the handling of natural and technical samples in relation to those of flat standard samples and emphasizes new special features. Pitfalls and sources of errors are clearly demonstrated as well as their efficient remedy when going from molecularly flat to rough surfaces. The academic or industrial scientist learns how to apply the principles for tackling their scientific or manufacturing tasks that include roughness far away from standard samples.
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E books E books PK Kelkar Library, IIT Kanpur
Available EBK8619
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Atomic Force Microscopy -- Scanning Near-Field Optical Microscopy -- Nanoindentation -- Nanoscratching.

Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm. New or improved instrumentation, new physical laws and unforeseen new applications in all branches of natural sciences (around physics, chemistry, mineralogy, materials science, biology and medicine) and nanotechnology are covered as well as the sources for pitfalls and errors. It outlines the handling of natural and technical samples in relation to those of flat standard samples and emphasizes new special features. Pitfalls and sources of errors are clearly demonstrated as well as their efficient remedy when going from molecularly flat to rough surfaces. The academic or industrial scientist learns how to apply the principles for tackling their scientific or manufacturing tasks that include roughness far away from standard samples.

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