Atomic and Nuclear Analytical Methods : XRF, M�ssbauer, XPS, NAA and B63Ion-Beam Spectroscopic Techniques /
By: Verma, H. R [author.].
Material type:
BookBerlin, Heidelberg : Springer Berlin Heidelberg, 2007. Description: XIV, 376 p. 128 illus. online resource.Content type: text Media type: computer Carrier type: online resourceISBN: 9783540302797.DDC classification: 530.8 | Item type | Current location | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|
| PK Kelkar Library, IIT Kanpur | Available | EBKS0008214 |
X-ray Fluorescence (XRF) and Particle-Induced X-ray Emission (PIXE) -- Rutherford Backscattering Spectroscopy -- Elastic Recoil Detection -- M�ssbauer Spectroscopy (MS) -- X-Ray Photoelectron Spectroscopy -- Neutron Activation Analysis -- Nuclear Reaction Analysis and Particle-Induced Gamma-Ray Emission -- Accelerator Mass Spectrometry (AMS).
This book is a blend of analytical methods based on the phenomenon of atomic and nuclear physics. It comprises comprehensive presentations about X-ray Fluorescence (XRF), M�ssbauer Spectroscopy (MS), X-ray Photoelectron Spectroscopy (XPS), Neutron- Activation Analysis (NAA), Particle Induced X-ray Emission Analysis (PIXE), Rutherford Backscattering Analysis (RBS), Elastic Recoil Detection (ERD), Nuclear Reaction Analysis (NRA), Particle Induced Gamma-ray Emission Analysis (PIGE), and Accelerator Mass Spectrometry (AMS). These techniques are commonly applied in the fields of medicine, biology, environmental studies, archaeology or geology et al. and pursued in major international research laboratories. 0
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