GETTERING AND DEFECT ENGINEERING IN SEMICONDUCTOR TECHNOLOGY, GADEST 2003
Contributor(s): Richter,H | | Kittler,M | .
Series: Solid State Phenomena, Part B Of"Diffusion And Defect Data". Publisher: Scitec Publications Ltd., Switzerland 2004Description: xvi,682.ISBN: 3908450829.Subject(s): Semiconductors -- Congresses | Getters -- Congresses | Silicon Crystals -- Defects -- CongressesDDC classification: 621.38152 | IN82| Item type | Current location | Collection | Call number | url | Status | Date due | Barcode | Item holds |
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PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 621.38152 IN82 (Browse shelf) | Book Request | Available | A151260 |
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| 621.38152 In8 ION IMPLANTATION IN SEMICONDUCTORS | 621.38152 IN8 WAFER SCALE INTEGRATION | 621.38152 IN8 BEAM INJECTION ASESSMENT OF DEFECTS IN SEMICONDUCTORS | 621.38152 IN82 GETTERING AND DEFECT ENGINEERING IN SEMICONDUCTOR TECHNOLOGY, GADEST 2003 | 621.38152 In8a APPLICATIONS OF ION BEAMS TO MATERIALS | 621.38152 IN8A ULTRAFAST PHENOMENA IN SEMICONDUCTORS | 621.38152 IN8A AMORPHOUS AND MICROCRYSTALLINE SEMICONDUCTORS |
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