VLSI RELIABILITY
Publisher: 1996Description: 366.Subject(s): Integrated Circuits--Very Large Scale Integration--Reliability -- CongressesDDC classification: 621.395 | T624V| Item type | Current location | Collection | Call number | url | Status | Date due | Barcode | Item holds |
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Books
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PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 621.395 T624V (Browse shelf) | Book Request | Available | A152479 |
Total holds: 0
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| 621.395 SH58R ROUTING IN THE THIRD DIMENSION | 621.395 SI26 SIGNAL INTEGRITY EFFECTS IN CUSTOM IC AND ASIC DESIGN | 621.395 St29f A formal approach to hardware design | 621.395 T624V VLSI RELIABILITY | 621.395 T834U ULSI SEMICONDUCTOR TECHNOLOGY ATLAS | 621.395 Un3e ESSENCE OF LOGIC CIRCUITS | 621.395 UY3F A FIRST COURSE IN DIGITAL SYSTEM DESIGN |
Includes Bibliography
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