DEFECT RECOGNITION AND IMAGE PROCESSING IN III-V COMPOUNDS
Contributor(s): Fillard, J. P [ed.].
Series: Materials Science Monographs. Publisher: Amsterdam Elsevier 1985Description: xii,306p.Subject(s): Semiconductors -- Defects -- Cong | Image Processing -- Cong | Gallium Arsenide -- CongDDC classification: 621.38152 | In8d| Item type | Current location | Collection | Call number | url | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|---|
Books
|
PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 621.38152 In8d (Browse shelf) | Book Request | Available | A95971 |
Total holds: 0
Browsing PK Kelkar Library, IIT Kanpur Shelves , Collection code: COMPACT STORAGE (BASEMENT) Close shelf browser
| 621.38152 IN8A ULTRAFAST PHENOMENA IN SEMICONDUCTORS | 621.38152 IN8A AMORPHOUS AND MICROCRYSTALLINE SEMICONDUCTORS | 621.38152 IN8A AMORPHOUS AND MICROCRYSTALLINE SEMICONDUCTORS | 621.38152 In8d DEFECT RECOGNITION AND IMAGE PROCESSING IN III-V COMPOUNDS | 621.38152 In8d DEFECT CONTROL IN SEMICONDUCTORS | 621.38152 IN8D V.2 DEFECT CONTROL IN SEMICONDUCTORS | 621.38152 IN8G GETTERING AND DEFECT ENGINEERING IN SEMICONDUCTOR TECHNOLOGY |
There are no comments for this item.