ELECTRON MICROSCOPY 1980
By: Brederoo.
Contributor(s): Boom, G | .
Publisher: Lieden 1980Description: 4 v.Subject(s): Electron And Microscopy -- CongressesDDC classification: 535.3325 | Eu74| Item type | Current location | Collection | Call number | url | Copy number | Status | Date due | Barcode | Item holds |
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Books
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PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 535.3325 Eu74 (Browse shelf) | Book Request | v. 3 | Available | A73197 |
Total holds: 0
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| 535.3325 D492 1980 Electron microscopy and analysis, 1979 (EMAG 79) | 535.3325 EL25 ELECTRON MICROSCOPY AND ANALYSIS | 535.3325 Eu74 ELECTRON MICROSCOPY 1972 | 535.3325 Eu74 ELECTRON MICROSCOPY 1980 | 535.3325 G925e ELECTRON MICROSCOPY IN THE STUDY OF MATERIALS | 535.3325 H313e ELECTRON OPTICS AND ELECTRON MICROSCOPY | 535.3325 H851 THE USE OF THE SCANNING ELECTRON MICROSCOPE |
Contents. -- V.1. Physics. -- V.2. Biology. -- V. 3. Analysis
Conference Incorporating The Ninth International Coference On X-Ray Optics And Microanalysis (Icxom)
Organized By The Nederlandse Vereniging Voor Elecgtronemicroscopie
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