RADIATION DAMAGE AND DEFECTS IN SEMICONDUCTORS
Series: Conference Series No. 16. Publisher: London Institute Of Physics 1973Description: xi,458.DDC classification: 621.38152 | R52Item type | Current location | Collection | Call number | url | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|---|
Books | PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 621.38152 R52 (Browse shelf) | Book Request | Available | A56420 |
Total holds: 0
Browsing PK Kelkar Library, IIT Kanpur Shelves , Collection code: COMPACT STORAGE (BASEMENT) Close shelf browser
621.38152 R252S SILICON PHOTONICS | 621.38152 R279 RALIABILITY AND DEGRADATION | 621.38152 R39 THE ROLE OF MICROSCOPY IN SEMICONDUCTOR FAILURE ANALYSIS | 621.38152 R52 RADIATION DAMAGE AND DEFECTS IN SEMICONDUCTORS | 621.38152 Sa87w WORKING WITH SEMICONDUCTORS | 621.38152 SC27 SCIENCE AND TECHNOLOGY OF ELECTROCERAMIC THIN FILMS | 621.38152 SE48K SELECTED PAPERS ON CCD AND CMOS IMAGERS |
There are no comments for this item.