PROCEEDINGS...
Publisher: Kansas City, Mo. 1965Description: 95,Y.Subject(s): Electronic Measurements -- Congresses | Electronic Measurements -- CongressesDDC classification: 621.381 | M584p| Item type | Current location | Collection | Call number | url | Status | Date due | Barcode | Item holds |
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Books
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PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 621.381 M584p (Browse shelf) | Book Request | Available | A1474 |
Total holds: 0
Browsing PK Kelkar Library, IIT Kanpur Shelves , Collection code: COMPACT STORAGE (BASEMENT) Close shelf browser
| 621.381 M583H MICROMECHANICS AND NANOSCALE EFFECTS | 621.381 M583O MOEMS | 621.381 M584b BASIC ELECTRICITY FOR ELECTRONICS | 621.381 M584p PROCEEDINGS... | 621.381 M781e ELECTRONICS | 621.381 M992r RELIABILITY ENGINEERING FOR ELECTRONIC SYSTEMS | 621.381 N131P PRINCIPLES OF MICROELECTRONICS TECHNOLOGY |
Includes Bibliography
Sponsored By The Kansas City Section Of The Institute Of Electrical And Electronics Engineers
Cover Title : Measurement And Instrumentation
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