Welcome to P K Kelkar Library, Online Public Access Catalogue (OPAC)

Normal view MARC view ISBD view

Techniques of electron microscopy, diffraction and microprobe analysis

By: A.S.T.M.
Series: ASTM special technical publication; 372. Publisher: Philadelphia American Society for Testing and Materials 1964Description: 89p.DDC classification: 669.950282 | Sy68t
    average rating: 0.0 (0 votes)
Item type Current location Collection Call number Vol info Status Date due Barcode Item holds
Written-off PK Kelkar Library, IIT Kanpur
Written-of 669.950282 Sy68t (Browse shelf) no.372 Not for loan A1216
Total holds: 0

Sponsored by subcommittee Xi on Electron Microstructure of Metals of ASTM Committee E-4 on Metallography

There are no comments for this item.

Log in to your account to post a comment.

Powered by Koha