ELECTRONIC COMPONENT TESTS & MEASUREMENTS
By: Middleton, Robert Gordon.
Material type:![materialTypeLabel](/opac-tmpl/lib/famfamfam/BK.png)
Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|
Written-off | PK Kelkar Library, IIT Kanpur | Written-of | 621.3815 M584eL (Browse shelf) | Not for loan | 54777 |
Total holds: 0
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621.3815 M192d DIGITAL CIRCUITS | 621.3815 M299e Electronic Instrumentation Fundamentals | 621.3815 M312d DIRECTORY OF ELECTRONIC CIRCUITS | 621.3815 M584eL ELECTRONIC COMPONENT TESTS & MEASUREMENTS | 621.3815 M584s SCOPE WAVEFORM ANALYSIS | 621.3815 M584t TEST EQUIPMENT CIRCUIT MANUAL | 621.3815 M589e ELECTRONIC TUBES AND SEMICONDUCTOR ELEMENTS |
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