Normal view MARC view ISBD view

Time-of-flight mass spectrometer for studies of ions produced by simulated micromecroroid impact

Series: NASA Technical Note. D-5794.Publisher: Washington NASA 1970Description: 37p.Subject(s): Aerodynamics

average rating: 0.0 (0 votes)

Item type	Current location	Collection	Call number	Vol info	Status	Date due	Barcode	Item holds
Technical Report	PK Kelkar Library, IIT Kanpur	COMPACT STORAGE (BASEMENT)		NASA TN D-5795	Not for loan		TR10052

Total holds: 0

Previous								Next
Previous	Stagnation-point solutions for inviscid radiating shock layers	Performance and deployment characteristics of a twin-keel parawing with various amounts and permeabilities of porous material in outer lobes	Orbiting astronomical observatory thermal test program	Time-of-flight mass spectrometer for studies of ions produced by simulated micromecroroid impact	High-altitude flight test of a 40-foot-diameter (12.2-meter) ringsail parachute at a deployment mach number of 2.95	Laser heating of ionized helium	Further experimental results on the influence of the turbulent boundary layer on panel flutter	Next

NASA TN -5790-99
Bound Vol.101193;Contents:TR10048-56

There are no comments for this item.

PKK Library