FACTORS AFFECTING RELIABILITY OF ALLOY JUNCTION TRANSISTORS
By: Wahl,A J,Kleimack,J J.
Material type: BookPublisher: Jet Propulsion Laboratory,Pasadena, California 1956Description: 9.DDC classification: BTS | MONO 2604Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|
Technical Report | PK Kelkar Library, IIT Kanpur | General Stacks | BTS MONO 2604 (Browse shelf) | Not for loan | TR18468 |
Total holds: 0
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BTS MONO 2601 THERMALLY INDUCED ACCEPTORS IN GERMANIUM | BTS MONO 2602 MICROWAVE DETECTOR | BTS MONO 2603 INFLUENCE OF HOLES AND ELECTRONS ON SOLUBILITY OF LITHIUM IN SILICON | BTS MONO 2604 FACTORS AFFECTING RELIABILITY OF ALLOY JUNCTION TRANSISTORS | BTS MONO 2605 A DOUBLE `-SLAB FERRITE FIELD DISPLACEMENT ISOLATOR AT 11 KMC | BTS MONO 2606 POWER SPECTRAL METHODS OF ANALYSIS AND APPLICATION IN AIRPLANE DYNAMICS | BTS MONO 2607 THEORY OF THE PHOTOMAGNETOELECTRIC EFFECT IN SEMICONDUCTORS |
Bound With Bts Mono 2581-2603,2605-2620 Lack No.2592,2593
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