MICRO-CONTROLLER BASED SEMI-AUTOMATIC DATA ACQUISITION SYSTEM FOR THE SIEMENS D500 X-RAY DIFFRACTOMETER
By: Krishnaiah,M V,Asuvathraman,R.
Contributor(s): Parthasarathi,R.
Material type:
BookSeries: Indira Gandhi Centre. Publisher: Indira Gandhi Centre For Atomic Research, Kalpakkam 2003Description: v,24.Subject(s): Automation | X-Ray DiffractionDDC classification: GOI-DAE | IGC-246/2003
| Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
Technical Report
|
PK Kelkar Library, IIT Kanpur | General Stacks | GOI-DAE IGC-246/2003 (Browse shelf) | Not for loan | TR20635 |
Total holds: 0
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