MICROWAVE IMPEDANCE MEASUREMENT IN JUNCTION REGION OF A SEMICONDUCTOR
By: Waltz,M C.
Material type: BookPublisher: 1959Description: 8.DDC classification: BTS | MONO 3380Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|
Technical Report | PK Kelkar Library, IIT Kanpur | General Stacks | BTS MONO 3380 (Browse shelf) | Not for loan | TR19209 |
Total holds: 0
Bound With Bts Mono 3376-3379,3381-3400
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