X-RAY INVESTIGATION OF THE PERFECTION OF SILICON
By: Carruthers,J R,Hoffman,R B.
Contributor(s): Ashner,J D.
Material type: BookPublisher: 1964Description: 5.DDC classification: BTS | MONO 4715Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|
Technical Report | PK Kelkar Library, IIT Kanpur | General Stacks | BTS MONO 4715 (Browse shelf) | Not for loan | TR18864 |
Total holds: 0
Browsing PK Kelkar Library, IIT Kanpur Shelves , Collection code: General Stacks Close shelf browser
BTS MONO 4712 APPROACH TO ADHESION VIA INTERFACIAL DEPOSITION OF AMPHIPATHIC MOLECULES | BTS MONO 4713 CALCIUM TUNGSTATE | BTS MONO 4714 INDUCTIVE BEHAVIOR OF SUPERCONDUCTING MAGNETS | BTS MONO 4715 X-RAY INVESTIGATION OF THE PERFECTION OF SILICON | BTS MONO 4716 SCATTERING FACTORS OF LOW-ENERGY ELECTRON DIFFRACTION | BTS MONO 4717 REACTIVE SPUTTERING | BTS MONO 4718 STORED PROGRAM COMPUTER AS A MULTIPAMETER NUCLEAR RADIATION ANALYZER |
Bound With Bts Mono 4701-14,4716-25
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