DAMAGE TO SILICON PRODUCED BY BOMBARDMENT WITH HELIUM IONS
By: Gianala,U F.
Material type: BookPublisher: 1957Description: 6.DDC classification: BTS | MONO 2881Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|
Technical Report | PK Kelkar Library, IIT Kanpur | General Stacks | BTS MONO 2881 (Browse shelf) | Not for loan | TR18831 |
Total holds: 0
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BTS MONO 2878 STRUCTURE OF TELLURIUM OXIDE GLASS | BTS MONO 2879 TIME LAG IN NUCLEATION | BTS MONO 2880 HIGH - FREQUENCY RELAXATION PROCESSES IN THE FIELD-EFFECT EXPERIMENT | BTS MONO 2881 DAMAGE TO SILICON PRODUCED BY BOMBARDMENT WITH HELIUM IONS | BTS MONO 2882 ACOUSTIC RELATIONS IN FERRITE SINGLE CRYSTALS | BTS MONO 2883 EFFECTS OF COMPRESSION AND ANNEALING ON PROPERTIES OF GERMANIUM | BTS MONO 2884 ON CREEP AND RELAXATION |
Bound With Bts Mono 2876-2880,2882-2900
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