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SURFACE MEASUREMENTS ON FRESHLY CLEAVED SILICON P-N JUNCTIONS

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BookPublisher: 1969Description: 6.DDC classification: BTS | MONO 3789

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Item type	Current location	Collection	Call number	Status	Date due	Barcode	Item holds
Technical Report	PK Kelkar Library, IIT Kanpur	General Stacks	BTS MONO 3789 (Browse shelf)	Not for loan Untraceable		TR19150

Total holds: 0

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Previous	BTS MONO 3786 POLARIZATION OF THE EDGE EMISSION IN CDS	BTS MONO 3787 OPERATION OF THE FIELD DISPLACEMENT ISOLATER IN RECTANULAR WAVEGUIDE	BTS MONO 3788 SPOKEN DIGIT RECOGNITION USING TIME-FREQUENCY PATTERN MATCHING	BTS MONO 3789 SURFACE MEASUREMENTS ON FRESHLY CLEAVED SILICON P-N JUNCTIONS	BTS MONO 3790 STUDIES OF AUGER ELECTRONS EJECTED FROM GERMANIUM BY SLOWLY MOVING POSITIVE IONS	BTS MONO 3791 FINE STRUCTURE IN THE OPTICAL ANISOTROPIC CRYSTALS	BTS MONO 3792 REACTIONS OF LITHIUM AS A DINIR AND AN ACCEPTOR IN ZINC OXIDE	Next

Bound With Bts Mono 3781-3788,3790-3820

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