BREAKDOWN IN SILICON
By: Senitzky,B.
Contributor(s): Moll,J L.
Material type:
BookPublisher: 1958Description: 8.DDC classification: BTS | MONO 3189
| Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
Technical Report
|
PK Kelkar Library, IIT Kanpur | General Stacks | BTS MONO 3189 (Browse shelf) | Not for loan | TR18365 |
Total holds: 0
Browsing PK Kelkar Library, IIT Kanpur Shelves , Collection code: General Stacks Close shelf browser
| BTS MONO 3186 PLASTICIZED POLY (VINYL CHLORIDE) FOR RETRACTILE CORDS | BTS MONO 3187 AUTOMATIC MEASUREMENT OF SMALL DEVIATIONS IN PERIODIC STRUCTURES | BTS MONO 3188 THERMAL EMBRITTLEMENT OF STRESSED POLYETHYLENE | BTS MONO 3189 BREAKDOWN IN SILICON | BTS MONO 3190 RECOMBINATION PROPERTIES OF GOLD IN SILICON | BTS MONO 3191 CERTAIN CHEMICAL TREATMENTS AND AMBIENT ATMOSPHERES ON SURFACE PROPERTIES OF SILICON | BTS MONO 3192 PHOTOCUNDUCTION AND SURFACE EFFECTS WITH ZINK OXIDE CRYSTALS |
Bound With Bts Mono 3176-88,3190-3200
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