MEASUREMENT OF MINORITY CARRIER LIFETIME IN GERMANIUM
By: Valdes,L B.
Material type:
BookPublisher: 1952Description: 4.DDC classification: BTS | MONO 2094
| Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
Technical Report
|
PK Kelkar Library, IIT Kanpur | General Stacks | BTS MONO 2094 (Browse shelf) | Not for loan | TR19517 |
Total holds: 0
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| BTS MONO 2090 THE L3 COAXIAL SYSTEM | BTS MONO 2092 Transistors in switching circuits | BTS MONO 2093 DYNAMICS OF TRANSISTORS NEGATIVE-RESISTANCE CIRCUITS | BTS MONO 2094 MEASUREMENT OF MINORITY CARRIER LIFETIME IN GERMANIUM | BTS MONO 2095 TRANSISTOR AMPLIFIER CUTOFF FREQUENCY | BTS MONO 2096 PROPERTIES OF M-1740 P-N JUNCTION PHOTOCELL | BTS MONO 2097 EFFECTS OF SPACE-CHARGE LAYER WIDENING IN JUNCTION TRANSISTORS |
Bound With Bts Mono 2077-2093,2095-2099 Lack No-2091
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