STATISTICAL TECHNIQUES FOR REDUCING EXPERIMENT TIME IN RELIABILITY STUDIES
By: Sobel,M.
Material type: BookPublisher: Microsoft Press, Redmond 1956Description: 25.DDC classification: BTS | MONO 2566Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|
Technical Report | PK Kelkar Library, IIT Kanpur | General Stacks | BTS MONO 2566 (Browse shelf) | Not for loan Untraceable | TR18414 |
Total holds: 0
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BTS MONO 2563 A CLASS OF BINARY SIGNALING ALPHABETS | BTS MONO 2564 COUPLED HELICES | BTS MONO 2565 GROWING WAVE DUE TO TRANSVERSE VELOCITIES | BTS MONO 2566 STATISTICAL TECHNIQUES FOR REDUCING EXPERIMENT TIME IN RELIABILITY STUDIES | BTS MONO 2568 SOLID-STATE DETECTOR FOR LOW-ENERGY IONS | BTS MONO 2569 STRUCTURE OF THE INTERMEDIATE STATE IN SUPERCONDUCTORS | BTS MONO 2570 ANODE BEHAVIOR OF GERMANIUM IN AUUEOUS SOLUTIONS |
Bound With Bts Mono 2551-2565,2567-2580.Lack No 2567
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