MEASUREMENT OF THE MICROSTRUCTURE BY THE METHOD OF SMALL ANGLES
By: Shifrin,K S.
Contributor(s): Golikov,V I.
Material type: BookPublisher: Nasa, Washington, D.C. 1965Description: 19.DDC classification: NASA | TT F-317Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|
Technical Report | PK Kelkar Library, IIT Kanpur | General Stacks | NASA TT F-317 (Browse shelf) | Not for loan | TR14632 |
Total holds: 0
Bound With Nasa Tt F-316,318-330
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