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MEASUREMENT OF THE MICROSTRUCTURE BY THE METHOD OF SMALL ANGLES

By: Shifrin,K S.
Contributor(s): Golikov,V I.
Material type: materialTypeLabelBookPublisher: Nasa, Washington, D.C. 1965Description: 19.DDC classification: NASA | TT F-317
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Item type Current location Collection Call number Status Date due Barcode Item holds
Technical Report Technical Report PK Kelkar Library, IIT Kanpur
General Stacks NASA TT F-317 (Browse shelf) Not for loan TR14632
Total holds: 0

Bound With Nasa Tt F-316,318-330

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