PROJECT "DIODE RELIABILITY PREDICTION TECHNIQUE"
By: Ryerson,C M.
Material type:
BookPublisher: Nasa, Washington, D.C. DDC classification: NASA | CR-702
| Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
Technical Report
|
PK Kelkar Library, IIT Kanpur | General Stacks | NASA CR-702 (Browse shelf) | Not for loan | TR11923 |
Total holds: 0
Bound With Nasa Cr-701, 703-05
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