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STRESS-STRAIN BEHAVIOR OF COLD-WELDED COPPER-COPPER MICROJUNCTIONS IN VACUUM AS DETERMINED FROM ELECTRICAL RESISTANCE MEASUREMENTS

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BookPublisher: Nasa, Washington, D.C. 1968Description: 20.DDC classification: NASA | TND-4743 -

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Item type	Current location	Collection	Call number	Status	Date due	Barcode	Item holds
Technical Report	PK Kelkar Library, IIT Kanpur	General Stacks	NASA TND-4743 - (Browse shelf)	Not for loan		TR9924

Total holds: 0

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Bound With Nasa Tnd 4741-50

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