AUTOMATIC TEST EQUIPMENT FOR ELECTRONIC COMPONENTS
By: Heffner,William A.
Material type: BookPublisher: Nasa,Washington, D.C. 1971DDC classification: NASA | CR-1754-55 -Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|
Technical Report | PK Kelkar Library, IIT Kanpur | General Stacks | NASA CR-1754-55 - (Browse shelf) | Not for loan Untraceable | TR8536 |
Total holds: 0
Browsing PK Kelkar Library, IIT Kanpur Shelves , Collection code: General Stacks Close shelf browser
NASA CR-1746 - STUDIES OF MULTIVARIABLE MANUAL CONTROL SYSTEMS | NASA CR-1747 - RESEARCH AND DEVELOPMENT PROGRAM ON THE USE OF COUNTING TECHNIQUES | NASA CR-1748 - PRINCIPLES FOR THE DESIGN ADVANCED FLIGHT DIRECTOR SYSTEM BASED ON THE THEORY OF MANUAL CONTROL DISPLAYS | NASA CR-1754-55 - AUTOMATIC TEST EQUIPMENT FOR ELECTRONIC COMPONENTS | NASA CR-1754-55 - AUTOMATIC TEST EQUIPMENT FOR ELECTRONIC COMPONENTS | NASA CR-1755 - EVALUATION OF TANTALUM/316 STAINLESS STEEL BIMETALLIC TUBING | NASA CR-1756 - SIMULATION OF A LARGE JET TRANSPORT AIRCRAFT |
Bound With Nasa Cr-1751-59
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