CONFIDENCE LEVEL FOR THE SAMPLE MEAN AND STANDARD DEVIATION OF A RAYLEIGH PROCESS
By: Keane,Leo M.
Material type:
BookSeries: Air Force Cambridge Research Laboratories-64-737. Publisher: Us Air Force Aerospace Research,, Bedford 1964Description: 7.DDC classification: TR | RL-64-737
| Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
Technical Report
|
PK Kelkar Library, IIT Kanpur | General Stacks | TR RL-64-737 (Browse shelf) | Not for loan | TR5691 |
Total holds: 0
Bound With: Afcrl-64-713-791
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