FAILURE ANALYSIS OF ELECTRONIC PARTS LABORATORY METHODS
By: Anstead,Robert J.
Contributor(s): Goldberg,Ethan.
Material type:
BookSeries: National Aeronautics And Space Administration Sp-6508. Publisher: Nasa, Washington, D.C. 1975Description: 79.DDC classification: TR | NASA-6508
| Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
Technical Report
|
PK Kelkar Library, IIT Kanpur | General Stacks | TR NASA-6508 (Browse shelf) | Not for loan | TR4881 |
Total holds: 0
Browsing PK Kelkar Library, IIT Kanpur Shelves , Collection code: General Stacks Close shelf browser
| TR NASA-5 Space scientists and engineers | TR NASA-5015 PROCEEDINGS... | TR NASA-6007 ELECTRICAL POWER MANAGEMENT SURVEY MANUAL | TR NASA-6508 FAILURE ANALYSIS OF ELECTRONIC PARTS LABORATORY METHODS | TR NASA-70 CONFERENC ON NUTRITION IN SPACE AND RELATED WASTE PROBLEMS NASA AND THE NATIONAL ACADEMY OF SCIENCE FLORIDA,1964 | TR NASA-7011 AEROSPACE MIDICINE AND BIOLOGY | TR NASA-7043 ENERGY |
Bound With: Nasa Sp-6007-6508
There are no comments for this item.