Fundamentals of atomic force microscopy
By: Reifenberger, Ronald.
Material type: BookSeries: Lessons From Nanoscience : A Lecture Note Series / Edited By Mark Lundstrom V.4. Publisher: New Jersey World Scientific 2016Description: xv, 324p.ISBN: 9789814630351.Subject(s): Atomic force microscopyDDC classification: 502.82 | R272f
Contents:
Contents: pt.1. Foundations
Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|
Books | PK Kelkar Library, IIT Kanpur | General Stacks | 502.82 R272f (Browse shelf) | Available | A182088 |
Total holds: 0
Browsing PK Kelkar Library, IIT Kanpur Shelves , Collection code: General Stacks Close shelf browser
502.82 M831A ATOMIC FORCE MICROSCOPY FOR BIOLOGISTS | 502.82 M951F FUNDAMENTALS OF LIGHT MICROSCOPY AND ELECTRONIC IMAGING | 502.82 M951f2 Fundamentals of light microscopy and electronic imaging | 502.82 R272f Fundamentals of atomic force microscopy | 502.82 R273t TRANSMISSION ELECTRON MICROSCOPY | 502.82 SC63 Scanning probe microscopy | 502.82 SC63P SCANNING PROBE MICROSCOPIES BEYOND IMAGING |
Contents: pt.1. Foundations
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