Fundamental principles of engineering nanometrology
By: Leach, Richard.
Material type:
BookPublisher: Amsterdam Elsevier 2014Edition: 2nd.Description: xxi, 361p.ISBN: 9781455777532.Subject(s): Nonometrology | NanotechnologyDDC classification: 620.50287 | L465f2
| Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
Books
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PK Kelkar Library, IIT Kanpur | General Stacks | 620.50287 L465f2 (Browse shelf) | Available | A181742 |
Total holds: 0
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