Identification of defects in semiconductors
By: .
Contributor(s): Stavola, Michael, Ed.
Material type:
BookSeries: Semiconductors And Semimetals / Edited By R. K. Willardson V.51b. Publisher: San Diego Academic Press 1999Description: xiv, 434p.Subject(s): Semiconductors -- Defects | Telecommunication systemsDDC classification: 621.38152 | Id26
| Item type | Current location | Collection | Call number | Copy number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|---|
Books
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PK Kelkar Library, IIT Kanpur | General Stacks | 621.38152 Id26 (Browse shelf) | Vol.1,2 | Available | A181465 |
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| 621.38152 H678s SEMICONDUCTOR POWER ELECTRONICS | 621.38152 H738 PHYSICAL PRINCIPLES OF SOLID STATE DEVICES | 621.38152 H742e Extended defects in semiconductors: electronic properties | 621.38152 Id26 Identification of defects in semiconductors | 621.38152 Id26 Identification of defects in semiconductors | 621.38152 Ih4s Semiconductor nanostructures | 621.38152 In88 Into the nano era |
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