Scanning probe microscopy : atomic scale engineering by forces and currents
By: Foster, A.
Contributor(s): Hofer, W.
Material type:
BookSeries: Nanoscience And Technology / Edited By P. Avouris. Publisher: New York Springer 2006Description: xiv, 281p.ISBN: 9780387400907.Subject(s): Scanning probe microscopy | Molecular structure | NanotechnologyDDC classification: 502.82 | F811s
| Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
Books
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PK Kelkar Library, IIT Kanpur | General Stacks | 502.82 F811s (Browse shelf) | Available | A180047 |
Total holds: 0
Browsing PK Kelkar Library, IIT Kanpur Shelves , Collection code: General Stacks Close shelf browser
| 502.82 C421i2 Introduction to scanning tunneling microscopy | 502.82 C874u Under the microscope | 502.82 Ea83a Atomic force microscopy | 502.82 F811s Scanning probe microscopy | 502.82 H191 Handbook of nanoscopy [2 v.] | 502.82 H191 Handbook of nanoscopy [2 v.] | 502.82 H192A HANDBOOK OF MICROSCOPY |
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