High-resolution X-ray scattering : from thin films to lateral nanostructures
By: Pietsch, Ullrich.
Contributor(s): Holy, Vaclav | Baumbach, Tilo.
Material type: BookPublisher: New York Springer 2004Edition: 2nd.Description: xvi, 408p.ISBN: 9780387400921.Subject(s): Thin films Optical properties | X-rays--Scattering | Xprays Diffraction | Nanostructure materialsDDC classification: 530.4175 | P618h2Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|
Books | PK Kelkar Library, IIT Kanpur | General Stacks | 530.4175 P618h2 (Browse shelf) | Available | A177057 |
Total holds: 0
Browsing PK Kelkar Library, IIT Kanpur Shelves , Collection code: General Stacks Close shelf browser
530.417 P954I INTRODUCTION TO SURFACE PHYSICS | 530.417 W291 Water in confining geometries | 530.4175 OR14U ORGANIC THIN FILMS AND SURFACES | 530.4175 P618h2 High-resolution X-ray scattering | 530.4175 ST42P THE PHYSICS OF THIN FILM OPTICAL SPECTRA | 530.4175 T714O ORDER IN THIN ORGANIC FILMS | 530.4175 Ul5i An introduction to ultrathin organic films from Lanmuir-Blodgett to self Assembly |
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