Test and diagnosis for small-delay defects
By: Tehranipoor, Mohammad.
Contributor(s): Peng, Ke.
Material type:
BookPublisher: New York Springer 2011Description: xviii, 212p.ISBN: 9781441982964.Subject(s): Integrated circuits--Fault tolerance | Integrated circuits--Testing | Delay faults (Semiconductors) | Integrated circuits--Very large scale integration--Defects | Integrated circuits--Very large scale integration--Testing | Engineering | Operating systems (Computers) | Systems engineeringDDC classification: 621.381548 | T233m
| Item type | Current location | Collection | Call number | url | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|---|
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PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 621.381548 T233m (Browse shelf) | Book Request | Available | A176091 |
Total holds: 0
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| 621.381548 R259c CATHODE RAY OSCILLOSCOPE | 621.381548 R542A ANALOG SIGNAL GENERATION FOR BUILT-IN-SELF-TEST OF MIXED-SIGNAL INTEGRATED CIRCUITS | 621.381548 St76a ATE | 621.381548 T233m Test and diagnosis for small-delay defects | 621.381548 T233n Nanometer technology designs high-quality delay tests | 621.381548 W391E ELECTRICAL MEASUREMENT, SIGNAL PROCESSING, AND DISPLAYS | 621.3815486 C42f Frequency synthesizers |
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