Kelvin probe force microscopy : measuring and compensating electrostatic forces
Contributor(s): Sadewasser, Sascha, ed | Glatzel, Thilo, ed.
Material type:
BookSeries: Springer series in surface sciences. edited By G. Ertl.Publisher: Berlin Springer 2012Description: xiv, 331p.ISBN: 9783642225659.Subject(s): Atomic force microscopyDDC classification: 502.825 | K299
| Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
Books
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PK Kelkar Library, IIT Kanpur | General Stacks | 502.825 K299 (Browse shelf) | Available | A173557 |
Total holds: 0
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| 502.825 EG28P PHYSICAL PRINCIPLES OF ELECTRON MICROSCOPY | 502.825 G618f Thin foil preparation for electron microscopy | 502.825 In1 In-situ electron microscopy at high resolution | 502.825 K299 Kelvin probe force microscopy | 502.825 L95 Low voltage electron microscopy | 502.825 M576S SCANNING PROBE MICROSCOPY | 502.825 M914I2 INTRODUCTION TO CONFOCAL FLUORESCENCE MICROSCOPY |
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