Aberration-corrected analytical transmission electron microscopy
Contributor(s): Brydson, Rik, ed.
Material type: BookPublisher: Chichester John Wiley & Sons 2011Description: xv, 280p.ISBN: 9780470518519.Subject(s): Transmission electron microscopyDDC classification: 502.825 | Ab37
Contents:
Published in association with royal microscopical society
Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|
Books | PK Kelkar Library, IIT Kanpur | General Stacks | 502.825 Ab37 (Browse shelf) | Available | A172708 |
Total holds: 0
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502.82 SCI27 SCIENCE OF MICROSCOPY | 502.82 W950m Microscope image processing | 502.82 X79 X-ray microscopy and spectromicroscopy | 502.825 Ab37 Aberration-corrected analytical transmission electron microscopy | 502.825 AD95 ADVANCED SCANNING ELECTRON MICROSCOPY AND X-RAY MICROANALYSIS | 502.825 B976d DYNAMIC EXPERIMENTS IN THE ELECTRON MICROSCOPE | 502.825 C76 ELECTRON MICROSCOPY AND ANALYSIS |
Includes bibliographical references and index
Published in association with royal microscopical society
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