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Lock-in thermography : basics and use for evaluating electronic devices and materials

By: Breitenstein, O.
Contributor(s): Warta, W.
Material type: materialTypeLabelBookSeries: Springer Series In Advanced Microelectronics / Edited By K. Itoh No.10. Publisher: Berlin Springer 2003Edition: 2nd.Description: x, 255p.ISBN: 9783642024160.Subject(s): Electronic apparatus and applications -- Thermal propertiesDDC classification: 621.381548 | B74l2
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Item type Current location Collection Call number url Status Date due Barcode Item holds
Books Books PK Kelkar Library, IIT Kanpur
COMPACT STORAGE (BASEMENT) 621.381548 B74l2 (Browse shelf) Book Request Available A173070
Total holds: 0

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