Reliability and radiation effects in compound semiconductors
By: Johnston, Allan.
Material type:
BookPublisher: New Jersey World Scientific 2010Description: xii, 363p.ISBN: 9789814277105.Subject(s): Radiation effectsDDC classification: 621.38152 | J641r
| Item type | Current location | Collection | Call number | url | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|---|
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PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 621.38152 J641r (Browse shelf) | Book Request | Available | A170796 |
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| 621.38152 IN8SI SILICON CARBIDE AND RELATED MATERIALS - 2002; ECSCRM 2002 | 621.38152 IN8SI SILICON CARBIDE AND RELATED MATERIALS 2001 | 621.38152 IN8SI SILICON CARBIDE AND RELATED MATERIALS - 2002; ECSCRM 2002 | 621.38152 J641r Reliability and radiation effects in compound semiconductors | 621.38152 J832 SEMICONDUCTOR DEVICES | 621.38152 K131c CHARACTERIZATION OF SEMICONDUCTOR MATERIALS | 621.38152 K131c CHARACTERIZATION OF SEMICONDUCTOR MATERIALS |
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