Precision Nanometrology : sensors and measuring systems for nanomanufacturing
By: Gao, Wei.
Material type:![materialTypeLabel](/opac-tmpl/lib/famfamfam/BK.png)
Item type | Current location | Collection | Call number | url | Status | Date due | Barcode | Item holds |
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PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 620.50287 G159p (Browse shelf) | Book Request | Available | A170046 |
Total holds: 0
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620.5 UL8 ULTRAFINE GRAINED MATERIALS | 620.5 W892M METASTABLE AND NANOSTRUCTURED MATERIALS | 620.5 W969m Micromachining using electrochemical discharge phenomenon | 620.50287 G159p Precision Nanometrology | 620.50287 L468f Fundamental principles of engineering nanometrology | 620.50287 N157 NANOSCALE CALIBRATION STANDARDS AND METHODS | 620.51 P38b COMPUTER ANALYSIS METHODS IN DYNAMICS |
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